US Patent Issued to FUJIFILM on Feb. 17 for "Printed material inspection device, printed material inspection method, program, and printing system" (Japanese Inventor)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,223, issued on Feb. 17, was assigned to FUJIFILM Corp. (Tokyo).

"Printed material inspection device, printed material inspection method, program, and printing system" was invented by Takashi Matsuda (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A printed material inspection device for detecting types of defects of a printed material by using inspection data based on a captured image of the printed material and reference data which is a digital image of a printing target image indicated by print data of the printed material, includes: one or more storage devices; and one or more processors configured to acquire the reference data, p...