US Patent Issued to FUJIFILM on April 14 for "Image analysis apparatus, image analysis method, and program" (Japanese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,761, issued on April 14, was assigned to FUJIFILM Corp. (Tokyo).

"Image analysis apparatus, image analysis method, and program" was invented by Kimito Katsuyama (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an image analysis apparatus, an image analysis method, and a program that can reduce erroneous detection of defective portions. An image analysis apparatus includes a processor. The processor is configured to acquire an infrared thermal image that is a captured image of a structure to be inspected, acquire a visible image that is a captured image of the structure to be inspected, determine a temperature defect from the infra...