US Patent Issued to FUJIFILM Business Innovation on June 9 for "Measurement apparatus and control apparatus" (Japanese Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,492, issued on June 9, was assigned to FUJIFILM Business Innovation Corp. (Tokyo).

"Measurement apparatus and control apparatus" was invented by Kei Takeyama (Ebina, Japan), Junichiro Hayakawa (Ebina, Japan), Yohei Morita (Ebina, Japan), Kaho Oi (Yokohama, Japan) and Emiko Shiraishi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement apparatus includes a light emitter that includes: a first light emission region emitting light toward a first area and a second light emission region emitting light toward a second area different from the first area; a light receiver that includes a first light reception region receiving light reflected f...