ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,787, issued on Sept. 22, was assigned to FUJI Corp. (Chiryu, Japan).
"Component inspection method and component inspection device" was invented by Keiichi Ono (Anjo, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A component inspection method according to the present disclosure includes imaging an upper surface of a board on which a component is mounted to acquire a color image in which a color of each pixel is represented by luminance values of multiple primary colors, extracting a pixel having a luminance value in a predetermined range corresponding to the color of the component among pixels constituting the color image as a specific pixel,...