ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,535, issued on Aug. 11, was assigned to FUJI Corp. (Chiryu, Japan).
"Electrical characteristic acquiring device" was invented by Tsuyoshi Mizukoshi (Chiryu, Japan), Masashi Kimura (Nishio, Japan) and Shuhei Mizutani (Yatomi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present disclosure is to acquire an open correction value in a good manner. In an electrical characteristic acquiring device according to the present disclosure, an open correction value, which is an electrical characteristic when the interval between a pair of probes is the length of a component to be measured on an electrode side, is calculated based on the ...