US Patent Issued to FEI on Feb. 17 for "Deep learning techniques for fast anomaly detection in experimental data" (Oregon Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,841, issued on Feb. 17, was assigned to FEI Co. (Hillsboro, Ore.).

"Deep learning techniques for fast anomaly detection in experimental data" was invented by Hans Vanrompay (Hillsboro, Ore.) and Maurice Peemen (Hillsboro, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are scientific instrument support systems, as well as related methods, apparatus, computing devices, and computer-readable media. Some embodiments provide a scientific instrument including detectors supporting one or more spectroscopic modalities and an imaging modality and further including an electronic controller configured to process streams of measurements re...