US Patent Issued to EXAIL, CENTRE NATIONAL D'ETUDES SPATIALES on May 19 for "Method for reducing the Kerr effect in an interferometry measuring device, and interferometry measuring device configured to implement this method" (French Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,451, issued on May 19, was assigned to EXAIL (Saint-Germain-en-Laye, France) and CENTRE NATIONAL D'ETUDES SPATIALES (Paris).

"Method for reducing the Kerr effect in an interferometry measuring device, and interferometry measuring device configured to implement this method" was invented by Eric Ducloux (Saint-Germain-en-Laye, France), Louis Lhomme (Saint-Germain-en-Laye, France), Nicolas Grossard (Saint-Germain-en-Laye, France) and Jerome Hauden (Saint-Germain-en-Laye, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a method for reducing the Kerr effect in an interferometry measuring device including a generator configured to emit a...