US Patent Issued to Everspin Technologies on Jan. 13 for "Systems and methods for scan chain interface for non-volatile storage bits" (Texas Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,272, issued on Jan. 13, was assigned to Everspin Technologies Inc. (Chandler, Ariz.).

"Systems and methods for scan chain interface for non-volatile storage bits" was invented by Syed M. Alam (Austin, Texas) and Jacob T. Williams (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scan chain circuitry for a memory device includes a first non-volatile storage bit (nvbit) configured to receive a shared control signal, a second nvbit configured to receive the shared control signal, a first flip-flop connected to the first nvbit, and a second flip-flop connected to the second nvbit and the first flip-flop. The first flip-flop enables loading...