US Patent Issued to EVER INFORMATION TECHNOLOGY on Jan. 20 for "Method for measuring non-contact biometric information" (South Korean Inventor)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,923, issued on Jan. 20, was assigned to EVER INFORMATION TECHNOLOGY Co. LTD. (Daejeon, South Korea).

"Method for measuring non-contact biometric information" was invented by Jae Du Chun (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for measuring a non-contact biometric information, includes steps of photographing an image including a user's face; detecting a face area in a frame of a photographed image; detecting a landmark within the face area and starting a tracking mode when a specific landmark is detected; detecting a movement of the face area in the tracking mode and determining a section in which the movement of...