US Patent Issued to ESPEC on May 12 for "Snow accretion test method and snow accretion test device" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,059, issued on May 12, was assigned to ESPEC CORP. (Osaka, Japan).

"Snow accretion test method and snow accretion test device" was invented by Hiroyuki Enoki (Osaka, Japan) and Haruki Seto (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a snow accretion test method, a snow accumulation step of accumulating snow on a specimen, and a snow accretion step of freezing snow accumulated on the specimen in a state where snow is not supplied to the specimen are performed. The snow accumulation step and the snow accretion step are repeatedly performed. In the snow accretion step, the ambient temperature of the specimen is adjusted to a temperat...