US Patent Issued to ENPLAS on March 24 for "Contact probe and socket for electrical component testing" (Japanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,945, issued on March 24, was assigned to ENPLAS Corp. (Kawaguchi, Japan).

"Contact probe and socket for electrical component testing" was invented by Yuta Inoue (Kawaguchi, Japan), Yasushige Komatsu (Kawaguchi, Japan) and Yasuyuki Sakamoto (Kawaguchi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present application provide a contact probe and a socket for electrical component testing. The contact probe includes a tubular structure within which a receiving cavity is formed, wherein a contact part for contacting a terminal of a first electrical component is provided at a first end of the tubular structure; a spring provided...