ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,667, issued on Sept. 29, was assigned to Elemental Scientific Inc. (Omaha, Neb.).
"Systems and methods for recovering organic contaminants from semiconducting wafers" was invented by Jacob Unnerstall (Omaha, Neb.), Brianna Dufek (Bennington, Neb.), Daniel R. Wiederin (Omaha, Neb.), Suhas Ketkar (San Diego), Austin Schultz (Omaha, Neb.), Kyle W. Uhlmeyer (Omaha, Neb.) and Beau A. Marth (La Vista, Neb.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are described for systems and methods for integrated decomposition and scanning of a semiconducting wafer for organic and inorganic impurities. In an aspect, a method includes, but is n...