US Patent Issued to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE on July 28 for "Apparatus and method for measuring dimension" (South Korean Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,553, issued on July 28, was assigned to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, South Korea).

"Apparatus and method for measuring dimension" was invented by Hye Jin S. Kim (Daejeon, South Korea) and Ji Yeon Son (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are an apparatus and method for measuring a dimension. The method of measuring a dimension according to an aspect of the present invention includes photographing a target object and generating an image, normalizing the image of the target object, generating normalized estimated dimension information about the target object from the normalize...