ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,226, issued on Aug. 4, was assigned to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, South Korea).

"Method and apparatus for learning dependency of feature data" was invented by Jaehwan Kim (Daejeon, South Korea), Jung Jae Yu (Daejeon, South Korea), Wonyoung Yoo (Daejeon, South Korea) and Juwon Lee (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A neural network device for learning dependency of feature data includes: a memory in which at least one program is stored; and a processor that performs a calculation by executing the at least one program, in which the processor is configured to acquire graph informatio...