ALEXANDRIA, Va., April 21 -- United States Patent no. 12,605,099, issued on April 21, was assigned to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, South Korea).
"Neural electrode for measuring neural signal and method for manufacturing the same" was invented by Yong Hee Kim (Daejeon, South Korea) and Sang Don Jung (Daejeon, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are a neural electrode for measuring a neural signal and a method for manufacturing the same. The method includes forming a bottom electrode on a substrate, forming a passivation layer exposing a portion of the bottom electrode, forming a metal layer including a gold nano-structure and a silver nano-st...