US Patent Issued to Ecopia Tech on Dec. 16 for "Vector data projection and feature matching to determine three-dimensional structure" (Canadian, American Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,620, issued on Dec. 16, was assigned to Ecopia Tech Corp. (Toronto).

"Vector data projection and feature matching to determine three-dimensional structure" was invented by Yuanming Shu (Toronto), Shuo Tan (Campbell, Calif.), Zihao Chen (Toronto) and Ruijie Deng (Toronto).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and systems for determining the height of structures based on imagery of the structures and associated two-dimensional vector data are provided. An example method involves projecting two-dimensional vector data outlining a roof of a structure into images of the structure captured from different perspectives and feature matching t...