US Patent Issued to ECOLE POLYTECHNIQUE DE MONTREAL on Dec. 2 for "Three-dimensional tracking and mapping of atomic planes in atom probe tomography imaging" (Canadian Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,456, issued on Dec. 2, was assigned to ECOLE POLYTECHNIQUE DE MONTREAL (Montreal).

"Three-dimensional tracking and mapping of atomic planes in atom probe tomography imaging" was invented by Sebastian Koelling (Montreal) and Oussama Moutanabbir (Montreal).

According to the abstract* released by the U.S. Patent & Trademark Office: "There are provided techniques for analyzing an atom probe tomography data set obtained from a tip-shaped sample. The techniques include defining analysis sub-volumes in the atom probe tomography data set; performing a fast Fourier transform (FFT) on each of the analysis sub-volumes to obtain a signal in a Fourier domain; identifying at least one FFT peak ...