US Patent Issued to ECOLE DE TECHNOLOGIE SUPERIEURE on June 16 for "Nondestructive testing system and method using reflected shear horizontal guided waves" (Canadian Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,317, issued on June 16, was assigned to ECOLE DE TECHNOLOGIE SUPERIEURE (Montreal).

"Nondestructive testing system and method using reflected shear horizontal guided waves" was invented by Pierre Belanger (Montreal), Andre Dionne (Montreal) and Aurelien Thon (Montreal).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and a system for nondestructive testing of a structure are provided. At least one ultrasonic probe is driven to cause at least one shear horizontal (SH) guided wave to propagate in the structure. At least one reflected guided wave signal is received from the structure to the at least one ultrasonic probe being driven. A comparison...