US Patent Issued to eBay on July 14 for "Machine learning-based interactive visual monitoring tool for high dimensional data sets across multiple KPIs" (California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,822, issued on July 14, was assigned to eBay Inc. (San Jose, Calif.).

"Machine learning-based interactive visual monitoring tool for high dimensional data sets across multiple KPIs" was invented by Ahmed Reda Mohamed Saeid Abdulaal (San Jose, Calif.) and Bass Chorng (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Described are computing systems and methods configured to detect a small, but meaningful, anomaly within one or more metrics associated with a platform. The system displays visuals of the metrics so that a user monitoring the platform can effectively notice a problem associated with the anomaly and take appropriate action to...