US Patent Issued to DUKE UNIVERSITY on Oct. 20 for "Fault criticality assessment using neural twins" (North Carolina Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,769,989, issued on Oct. 20, was assigned to DUKE UNIVERSITY (Durham, N.C.).

"Fault criticality assessment using neural twins" was invented by Krishnendu Chakrabarty (Durham, N.C.) and Arjun Chaudhuri (Durham, N.C.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of fault criticality assessment using neural twins includes converting a netlist into a neural twin by replacing each circuit element of the netlist with a neural-network-readable cell equivalent; and replacing each wire with a neural connection. Bias value adders are inserted at locations in the neural twin; and these bias value adders are used to apply a bias that represents a perturbat...