US Patent Issued to DONGWOO FINE-CHEM on Sept. 15 for "Method and apparatus for estimating nanoparticles in a solution" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,453, issued on Sept. 15, was assigned to DONGWOO FINE-CHEM Co. LTD. (Jeollabuk-do, South Korea).

"Method and apparatus for estimating nanoparticles in a solution" was invented by Sung Ho Baek (Jeollabuk-do, South Korea), Gi Hwan Ahn (Jeollabuk-do, South Korea), Min Ju Lee (Jeollabuk-do, South Korea), Tae Yong Kim (Jeollabuk-do, South Korea), Soo Yeong Lim (Jeollabuk-do, South Korea), Su Young Choi (Jeollabuk-do, South Korea) and Min Gi Hwang (Jeollabuk-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a method for estimating nanoparticles in a solution, a laser-induced plasma is generated by making a pulsed laser beam incident on in...