ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,778,463, issued on Nov. 3, was assigned to DiaMonTech AG (Berlin).

"Method and apparatus for analyte measurement including real-time quality assessment and improvement" was invented by Werner Mantele (Kiefersfelden-Muhlbach, Germany), Thorsten Lubinski (Berlin), Sergius Janik (Berlin) and Michael Kaluza (Berlin).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of analyzing a material (12) comprising at least one analyte, wherein analyte-wavelength-specific measurements are interspersed with reference measurements (80), and wherein response signals obtained for the reference measurements (80) are used for one or more of calibrating an excitation rad...