ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,714,337, issued on Aug. 25, was assigned to DiaMonTech AG (Berlin).
"Method and apparatus for analyte measurement including material status analysis" was invented by Werner Mantele (Kiefersfelden-Muhlbach, Germany), Thorsten Lubinski (Berlin), Sergius Janik (Berlin) and Michael Kaluza (Berlin).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of analyzing a material (12) comprising at least one analyte, said method comprising a material status analyzing procedure (76), in which a present status of the material is analyzed, wherein based on a result of said material status analyzing procedure (76), at least one of a selection of analyte-characterist...