US Patent Issued to Dexerials on Oct. 20 for "Testing chip and method for manufacturing same" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,766,504, issued on Oct. 20, was assigned to Dexerials Corp. (Shimotsuke, Japan).

"Testing chip and method for manufacturing same" was invented by Takuya Monju (Shimotsuke, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The testing chip includes a first layer on one surface side and a second layer on another surface side, in which either the first layer or the second layer has a liquid-receiving section A, the first layer has at least a detection-confirming section B, the second layer has at least a liquid-distributing section D adjacent to the detection-confirming section B and a liquid flow path E connected to the liquid-distributing section D, t...