US Patent Issued to DEXCOM on Feb. 24 for "Diffusion resistance layer for analyte sensors" (California, Pennsylvania Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,570, issued on Feb. 24, was assigned to DEXCOM INC. (San Diego).

"Diffusion resistance layer for analyte sensors" was invented by Jiong Zou (San Diego), Robert J. Boock (Carlsbad, Calif.), Andrew Trinin Dennis (La Jolla, Calif.), Ted Tang Lee (San Diego), Jeff T. Suri (Fallbrook, Calif.), David Sze (San Diego), Mark A. Tapsak (Bloomsburg, Pa.), Huashi Zhang (San Diego) and Shanger Wang (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are devices for determining an analyte concentration (e.g., glucose). The devices comprise a sensor configured to generate a signal associated with a concentration of an analyte and a sensing membrane...