US Patent Issued to DELTA ELECTRONICS on Nov. 3 for "Projection calibration method and projection calibration system" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,276, issued on Nov. 3, was assigned to DELTA ELECTRONICS INC. (Taoyuan City, Taiwan).

"Projection calibration method and projection calibration system" was invented by Lai-Hsuan Liu (Taoyuan City, Taiwan) and Chung-Yi Yang (Taoyuan City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A projection calibration method includes transmitting a calibration command to an edge node by a center node, acquiring a projection image of a test pattern image by the edge node, performing image processing on the acquired projection n image by the edge node based on the calibration command to get a calibration parameter data, transmitting the calibration parame...