US Patent Issued to Dell Products on Nov. 3 for "Dynamic test selection and prioritization using association rule mining for continuous integration" (Indian Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,783,390, issued on Nov. 3, was assigned to Dell Products LP (Round Rock, Texas).

"Dynamic test selection and prioritization using association rule mining for continuous integration" was invented by Hemant Gaikwad (Pune, India) and Jagadeesh Venugopal (Bengaluru, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, system, and non-transitory processor-readable storage medium for a test selection and prioritization system are provided herein. An example method includes mining, by the system, a test case repository comprising test cases and execution results, to identify relationships between test cases based on the execution of the test cases acco...