US Patent Issued to Dell Products on May 5 for "Detecting duplicate incidents using machine learning techniques" (Virginia, New Hampshire, Massachusetts, North Carolina, Florida Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,619,619, issued on May 5, was assigned to Dell Products LP (Round Rock, Texas).

"Detecting duplicate incidents using machine learning techniques" was invented by Shreyans Jasoriya (Brighton, Mass.), Anil Kumar Koluguri (Durham, N.C.), David C. Sydow (Merrimack, N.H.), Sebastian Brunet (Miami) and Soham Joshi (Reston, Va.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, apparatus, and processor-readable storage media for detecting duplicate incidents using machine learning techniques are provided herein. An example method includes obtaining information associated with tracking a first incident in an incident database, generating a summary of the fir...