US Patent Issued to Dell Products on June 23 for "One regression detection testing method" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,073, issued on June 23, was assigned to Dell Products LP (Round Rock, Texas).

"One regression detection testing method" was invented by Changxu Jiang (Chengdu, China), Robin Fei Wang (Chengdu, China) and Huijuan Fan (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, system, and non-transitory processor-readable storage medium for a regression detection testing system are provided herein. An example method includes receiving a pull request to merge software code changes and parsing a pull request code difference file to identify a plurality of software modules and software functions. A test case attribute associated with a test c...