ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,758, issued on June 23, was assigned to Dell Products LP (Round Rock, Texas).
"Detecting device component defects and generating corresponding recommendations using artificial intelligence techniques" was invented by Ravi Shukla (Bengaluru, India), Jeffrey Scott Vah (Round Rock, Texas), Wilson Tetsuia Kitsunai (Sorocaba, Brazil) and Aaron Sanchez (Austin, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, apparatus, and processor-readable storage media for detecting device component defects and generating corresponding recommendations using artificial intelligence techniques are provided herein. An example computer-implemented method incl...