US Patent Issued to Dell Products on July 7 for "Identifying root causes of test failures" (Chinese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,675,358, issued on July 7, was assigned to Dell Products LP (Round Rock, Texas).

"Identifying root causes of test failures" was invented by Joseph Shi (Shanghai), Xiaowei Shen (Shanghai), Jinghui Zhang (Shanghai) and Shuyu Zhao (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A disclosed method defines root cause failure categories for a test case and associates each category with a corresponding test configuration property. Test configuration property information, indicative of the test configuration properties, are embedded in test case metadata. After generating test results, including test script messages, the test script messages assessed to...