US Patent Issued to Dell Products on Jan. 27 for "Cluster node selection with off-band metrics" (Irish, Indian Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,084, issued on Jan. 27, was assigned to Dell Products LP (Round Rock, Texas).

"Cluster node selection with off-band metrics" was invented by Sirisha Karnam (Bangalore, India), Charulata Ojha (Rochestown, Ireland) and Tamilarasan Janakiraman (Rochestown, Ireland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system can determine respective on-band metrics for respective nodes of a group of nodes that are part of a computing cluster, wherein a first part of the group of nodes are active to the computing cluster, and wherein a second part of the group of nodes are inactive to the computing cluster. The system can determine respective off-band metrics...