US Patent Issued to Dell Products on Aug. 4 for "Statistics and feedback-based scan framework for cluster nodes" (Massachusetts Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,611, issued on Aug. 4, was assigned to Dell Products LP (Hopkinton, Mass.).

"Statistics and feedback-based scan framework for cluster nodes" was invented by Lixin Pang (Needham, Mass.) and Rong Yu (West Roxbury, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A statistics and feedback-based diagnostic scan framework for cluster nodes is provided, that prioritizes work items for processing by cluster nodes according to work item priority. A heatmap of work items is created and used by the diagnostic scan framework to prioritize work items for processing by the cluster nodes. The heatmap may be created from runtime IO operations, metadata access/u...