US Patent Issued to Dell Products on April 14 for "Smart mechanism to evaluate performance of test engineers" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,313, issued on April 14, was assigned to Dell Products LP (Round Rock, Texas).

"Smart mechanism to evaluate performance of test engineers" was invented by Huijuan Fan (Chengdu, China) and Steven Wenguo Shen (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, system, and non-transitory processor-readable storage medium for a resource evaluation system are provided herein. An example method includes obtaining defect data obtained in response to executing software on a plurality of tester systems. The resource evaluation system determines a performance weighted metric associated with a defect detection resource and the defect data....