US Patent Issued to DAICEL on March 31 for "Abnormal irregularity cause identifying device, abnormal irregularity cause identifying method, and abnormal irregularity cause identifying program" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,233, issued on March 31, was assigned to DAICEL Corp. (Osaka, Japan).

"Abnormal irregularity cause identifying device, abnormal irregularity cause identifying method, and abnormal irregularity cause identifying program" was invented by Hiroki Oka (Tokyo), Koichi Yamano (Tokyo), Fumihiro Miyoshi (Tokyo), Hiroyasu Kondo (Tokyo) and Hidetoshi Kozono (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormal irregularity cause identifying device includes a process data acquisition unit that reads, from a storage device storing process data, the pieces of process data, an abnormality determination unit that calculates an abnormality degree repres...