ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,341, issued on Feb. 17, was assigned to CORNELL UNIVERSITY (Ithaca, N.Y.).
"Rapid generation of custom-fit garment patterns from 3D body scans" was invented by Jie Pei (Greenville, Texas) and Susan P. Ashdown (Ithaca, N.Y.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, device, system and one or more computer readable media having one or more computer programs with instructions to generate custom-fit garment patterns from a 3D body scan are disclosed. The patterns may be obtained by unwrapping the 3D body scan (3D image) into 2D using defined datapoints associated with the surface of a body in a target region. Patterns may be generated for d...