US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on Nov. 3 for "Surface density device calibration apparatus and surface density device calibration method" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,256, issued on Nov. 3, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Surface density device calibration apparatus and surface density device calibration method" was invented by Qiangjun Wang (Ningde, China), Jingdong Zhang (Ningde, China), Zhihui Zhen (Ningde, China), Bingyang Zhan (Ningde, China), Weigang Chen (Ningde, China) and Qian Wu (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Method and apparatus for calibrating a surface density measurement device are provided, and relate to the field of battery testing devices. The apparatus for calibrating the surface density measurement device calibration a...