US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on May 12 for "Test method, test apparatus, test system, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,027, issued on May 12, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Test method, test apparatus, test system, and storage medium" was invented by Hongyu Zheng (Ningde, China), Shaoteng Ren (Ningde, China) and Si Lin (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test method, a test apparatus, a test system, and a storage medium are provided, so as to solve the technical problem of how the leakage of a battery cell is detected. The test method of this embodiment of this application includes: (S10) obtaining a CAN signal output by a gas sensor, where the gas sensor is disposed on a test box, and a batt...