US Patent Issued to Contemporary Amperex Technology (Hong Kong) on June 9 for "Test system and test method therefor" (Chinese Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,475, issued on June 9, was assigned to Contemporary Amperex Technology (Hong Kong) Ltd. (Hong Kong).

"Test system and test method therefor" was invented by Jiawu Cheng (Ningde, China), Xueqing Gong (Ningde, China), Guangwei Zhou (Ningde, China), Kai Zhou (Ningde, China) and Haijie Wang (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test system comprises a test circuit board, a test device, a lower computer, and an upper computer. The test circuit board includes a test circuit, the test circuit comprising multiple main lines arranged side by side, one end of each of the main lines being used to connect with a positive electrode or a n...