ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,173, issued on March 24, was assigned to CKD Corp. (Aichi, Japan).
"Apparatus for hair inspection on substrate and method for hair inspection on substrate" was invented by Kazuyoshi Kikuchi (Aichi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for hair inspection includes: an inspection unit that obtains, with a plurality of color lights, a color image of an inspection object board that is the printed circuit board as an inspection target; and a control device that: obtains a hue image of the inspection object board from the color image; obtains a saturation image of the inspection object board from the color image; detects firs...