US Patent Issued to CiTEX Holding on Sept. 1 for "X-ray measuring method and X-ray measuring device for measuring a strand" (German Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,995, issued on Sept. 1, was assigned to CiTEX Holding GmbH (Melle, Germany).

"X-ray measuring method and X-ray measuring device for measuring a strand" was invented by Arno Neumeister (Porta Westfalica, Germany) and Christoph Herrmann (Karlsbad, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to an X-ray measuring method and an X-ray measuring device for measuring a strand."

The patent was filed on Dec. 7, 2023, under Application No. 18/532,137.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%...