US Patent Issued to Ciena on May 19 for "Calibration data from modules for an incremental noise metric for rapid modeling of optical networks" (Canadian Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,634,607, issued on May 19, was assigned to Ciena Corp. (Hanover, Md.).

"Calibration data from modules for an incremental noise metric for rapid modeling of optical networks" was invented by Alex W. MacKay (Ottawa), Fangyuan Zhang (Kanata, Canada), David W. Boertjes (Nepean, Canada) and Andrew D. Shiner (Ottawa).

According to the abstract* released by the U.S. Patent & Trademark Office: "A module for use in an optical network includes one or more elements concatenated to one another; and circuitry configured to receive and store calibration data associated with the one or more elements, and transmit the calibration data to one or more processing devices for modeling of the module in a ...