ALEXANDRIA, Va., April 15 -- United States Patent no. 12,603,468, issued on April 14, was assigned to Ciena Corp. (Hanover, Md.).

"Optical amplifier failure prediction using machine learning" was invented by Carter Demars (Nepean, Canada), Yinqing Pei (Kanata, Canada) and David W. Boertjes (Nepean, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for optical amplifier failure prediction using Machine Learning (ML), such as for an Erbium-Doped Fiber Amplifier (EDFA), are described. A method include obtaining a plurality of inputs from an optical amplifier associated with an optical network; analyzing the plurality of inputs with a trained machine learning model; obtaining an estimate ...