US Patent Issued to CHUNGHWA PRECISION TEST TECH. on June 23 for "Cantilever probe card device and cantilever probe module" (Taiwanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,439, issued on June 23, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan).

"Cantilever probe card device and cantilever probe module" was invented by Hao-Yen Cheng (Taoyuan City, Taiwan), Rong-Yang Lai (Taoyuan City, Taiwan), Chao-Hui Tseng (New Taipei City, Taiwan) and Wei-Jhih Su (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A cantilever probe module includes a plurality of first probes and a plurality of second probes. Each of the first probes includes a first arm segment, a first main segment, and a first testing segment, the latter two of which are respectively connected to two ends of the fir...