US Patent Issued to CHROMA ATE on June 30 for "Inspection system with thermal interface, and electronic component inspection device and method" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,537, issued on June 30, was assigned to CHROMA ATE INC. (Taoyuan City, Taiwan).

"Inspection system with thermal interface, and electronic component inspection device and method" was invented by I-Shih Tseng (Taoyuan City, Taiwan), Chin-Yi Ou Yang (Taoyuan City, Taiwan), I-Ching Tsai (Taoyuan City, Taiwan) and Xin-Yi Wu (Taoyuan City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system with a thermal interface, and an electronic component inspection device and method are provided. First, a temperature regulator contacts an electronic component to be tested, where there is a thermal interface between the temperature regulator an...