ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,582, issued on April 14, was assigned to CHROMA ATE INC. (Taoyuan City, Taiwan).

"Detection system, compensation method, and computer readable medium for semiconductor surface morphology" was invented by Hao-Chiang Hu (Taoyuan City, Taiwan), Wei-Che Chang (Taoyuan City, Taiwan), Ming-Kai Hsueh (Taoyuan City, Taiwan) and Chia-Hung Lin (Taoyuan City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a detection system, compensation method and computer-readable recording medium applicable to semiconductor surface morphology to provide feature information corresponding to spectral signals to a neural network model and provide feature i...