US Patent Issued to CHOTEST TECHNOLOGY on Oct. 6 for "Method for measuring orthogonality of orthogonal axis system" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,015, issued on Oct. 6, was assigned to CHOTEST TECHNOLOGY INC. (Shenzhen, China).

"Method for measuring orthogonality of orthogonal axis system" was invented by Zhiwei Zhang (Shenzhen, China), Yuan Chen (Shenzhen, China), Hejun Zhang (Shenzhen, China), Furong Feng (Shenzhen, China), Xuewen Liao (Shenzhen, China) and Longjun Cheng (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Some embodiments of the disclosure provide a method for measuring orthogonality of an orthogonal axis system, In some examples, the method includes following steps: placing an instrument on a bearing surface, intercepting a second rotary axis along an intercepti...