US Patent Issued to CHINA SCIENCE PHOTON CHIP (HAINING) TECHNOLOGY on Sept. 29 for "Three-dimensional scanning ranging device and method" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,191, issued on Sept. 29, was assigned to CHINA SCIENCE PHOTON CHIP (HAINING) TECHNOLOGY Co. LTD. (Jiaxing, China).

"Three-dimensional scanning ranging device and method" was invented by Jingwei Liu (Jiaxing, China), Wenling Li (Jiaxing, China) and Zhonghui Wei (Jiaxing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A three-dimensional scanning ranging device, including: an optical scanning chip (1), a focusing lens (2), a light receiving element (3) and a microprocessor, wherein the optical scanning chip (1) may be used for sequentially scanning and outputting line-shaped light spots of a plurality of scanning angles onto a to-be-measured ob...