US Patent Issued to CHINA JILIANG UNIVERSITY on March 31 for "Reference sample suitable to calibrate magnetic microscope's probe tip and calibration method" (Chinese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,988, issued on March 31, was assigned to CHINA JILIANG UNIVERSITY (Hangzhou, China).

"Reference sample suitable to calibrate magnetic microscope's probe tip and calibration method" was invented by Xiukun Hu (Hangzhou, China), Shuai Yang (Hangzhou, China), Qiong Wu (Hangzhou, China), Hangfu Yang (Hangzhou, China) and Jiage Jia (Hangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention discloses a reference sample suitable to calibrate a magnetic microscope's probe tip and a calibration method. The reference sample is a magnetic micro-nanostructure made of a magnetic material and formed on the surface of a substrate materia...