US Patent Issued to CHINA JILIANG UNIVERSITY on April 7 for "Method for measuring DAC nonlinearity error based on pseudo-random sequence" (Chinese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,938, issued on April 7, was assigned to CHINA JILIANG UNIVERSITY (Hangzhou, China).

"Method for measuring DAC nonlinearity error based on pseudo-random sequence" was invented by Yaqiong Fu (Hangzhou, China), Jianting Zhao (Hangzhou, China), Yunfeng Lu (Hangzhou, China) and Lushuai Qian (Hangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a method for measuring a DAC nonlinearity error based on a pseudo-random sequence. The method includes: numbering pseudo-random number values in a pseudo-random sequence to generate a serial number sequence; arranging the pseudo-random number values in the serial number sequence in a descendin...